Publication

Thermal transport in a semiconductor heterostructure measured by time-resolved x-ray diffraction

Author List: Y. M. Sheu, S. H. Lee, J. K. Wahlstrand, D. A. Walko, E. C. Landahl, D. A. Arms, M. Reason, R. S. Goldman, and D. A. Reis

Journal Reference: Physical Review B, 78(4):045317, 2008.

Online Journal Link: http://prb.aps.org/abstract/PRB/v78/i4/e045317

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