Publication

Use of real-time Fourier transform infrared reflectivity as an in situ monitor of YBa2Cu3O7 film deposition and processing

Author List: Koster, G., Jeong-Uk Huh, Hammond, R.H., et al.

Journal Reference: Applied Physics Letters Volume: 90 Issue: 26 Pages: 261917/1-3, 25 June 2007.

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