Center for Probing the Nanoscale: An NSF Nanoscale Science and Engineering Center
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Graduate Education

Providing a rich, well-rounded graduate education is a central mission of the Center for Probing the Nanoscale. The CPN Fellows program enables graduate students to gain expertise in nanofabrication, materials characterization and state-of-the-art design, and operation of nanoprobes, as well as interpretation of the resulting data. CPN Fellows interact with colleagues at Stanford and IBM through Center-sponsored curriculum, seminars and field trips to the research labs of industrial partners. CPN Fellows will also play a vital role in the Summer Institute for Middle School Teachers through mentoring and sharing their knowledge. Through these experiences CPN Fellows will graduate with an impressive combination of technical engineering skills, scientific understanding, and communication skills.

The CPN offers the course Probing the Nanoscalefor beginning graduate students and advanced undergraduates. The audio and video presentations of this course are intended to be a seminal reference for the nanoscale scientific community. Lectures will also be made available to the public through the CPN website and will be downloadable through the Stanford iPod project. In addition, the CPN has partnered with the Office of Accessible Education on the Proteus Project to make the course materials available in a wide range of formats including subtitled videos and transcripts of the lectures.

 Probing the Nanoscale (Applied Physics 275)

Description: Introduction to the theory, operation and applications of nanoprobes of interest in physics and materials science. Lectures by experts on various types of nanoprobes along with associated discussion sessions. Specific topics include: scanning tunneling microscopy, scanning tunneling spectroscopy, scanning tunneling potentiometry, atomic manipulation, scanning magnetic sensors, scanning magnetic resonance, scanning field-effect gates, scanning force probes and ultra-near-field optical scanning.

 
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