Helios Focused Ion Beam (FIB) Laboratory

The instrument is an FEI Helios NanoLab 600i DualBeam FIB/SEM, containing both a focused Ga+ ion beam ("Tomahawk") and a high resolution field emission scanning electron ("Elstar") column. Combined with advances in patterning, scripting, and a suite of accessories, these features make milling, imaging, analysis, and sample preparation down to the nanoscale possible as standard applications in the lab.


Restrictions on samples

The sample material must be able to withstand a high vacuum environment without outgassing. It must be clean. It may be attached to the sample holder using a suitable SEM vacuum-quality adhesive (please check with us first). The sample must be electrically grounded to the sample holder to minimize sample charging. If the sample is nonconductive (plastic, fiber, polymer, or other substance with an electrical resistance greater than 1E10 ohms), certain strategies may need to be employed for successful work, and please check with us regarding those.

Training and Service

Before being considered for training on the FEI Helios NanoLab FIB/SEM, you must first be a fully qualified user of the FEI DB235 Dual-Beam FIB/SEM. Further information is on the training info page.

Service requests will be considered on a case-by basis. However, our normal mode of operation is to train users to perform the characterization experiments themselves.


(information from FEI)