Computer Systems Laboratory Colloquium

4:15PM, Wednesday, March 02, 2005
NEC Auditorium, Gates Computer Science Building B03

Transistor Scaling and its Impact on Analog/RF Device Performance

Kelin J. Kuhn
Portland Technology Development, Intel Corporation
About the talk:

Over the last three decades, microprocessors have demonstrated performance improvements of greater than five orders of magnitude. It is no secret that these improvements have largely been enabled by transistor scaling. However, it is less clear if transistor scaling also enables performance improvements for analog and RF circuits. This talk explores the benefits and costs of applying conventional transistor scaling to analog and RF devices

About the speaker:

Kelin Kuhn is the Device Manager for the Intel 45nm CMOS technology being developed at the Portland Technology Development Center. Dr. Kuhn joined the Intel Corporation in 1997, and since joining Intel has held a variety of technical positions on the 0.35um, 130nm, and 90nm nodes, including (most recently) serving as the integration manager for the RF/analog derivative technology on 90nm. Prior to joining Intel, Dr. Kuhn was a tenured faculty member in the Dept. of Elec. and Comp. Engineering at the University of Washington. She received the B.S. in Electrical Engineering from the University of Washington in 1980, and the M.S. and Ph.D. in Electrical Engineering from Stanford University in 1985. Dr. Kuhn is the author of numerous technical publications on optical and electronic properties of semiconductor devices as well as author of the text Laser Engineering.

Contact information:

Kelin J. Kuhn