From Murmann Mixed-Signal Group
BSEE, University of Connecticut, 2013
Research: Cutoff Circuit for Electrochemical Etching Applications
The resolution of electron emission based microscopy (such as Scanning Tunneling Microscopy (STM) and Scanning Electron Microscopy (SEM)) improves as the diameter of the emitting probe decreases. Manufacture of high quality probes is costly, particularly when considering the limited lifespan of an individual probe. My research focuses on the design and implementation of a circuit to produce atomically sharp probes through an electrochemical etching process.