- Associate Editor, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2020-present.
- Guest Co-Editor, IEEE Micro, Special Issue on the 2016 Hotchips, 2017.
- Guest Co-Editor, IEEE Journal of Solid-State Circuits, Special Issue on the 2016 IEEE International Solid-State Circuits Conference, 2017.
- Guest Co-Editor, IEEE Journal of Emerging and Selected Topics in Circuits and Systems, Special Issue on Robust and Energy-Secure Systems, 2014.
- Guest Co-Editor, IEEE Transactions on Nanotechnology, Special Issue on Functionally Enhanced Devices, 2014.
- Guest Co-Editor, IEEE Journal of Emerging and Selected Topics in Circuits and Systems, Special Issue on Heterogeneous Nano Circuits and Systems, 2013.
- Associate Editor, ACM Transactions on Design Automation of Electronic Systems, 2011-2012.
- Associate Editor, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2010-2011.
- Associate Editor, IEEE Transactions on VLSI Systems, 2009-2010.
- Program Chair, IEEE International Conference on VLSI Design, 2020.
- Executive Committee Member and Special Day Co-organizer, IEEE Design Automation and Test in Europe, 2018, 2010.
- Track Co-Chair, IEEE Design Automation and Test in Europe, 2018-2020.
- Organizing Committee Member, Berkeley Symposium on Energy Efficient Electronic Systems, 2017.
- Program Chair, Hotchips, 2016.
- Program Chair, IEEE International Test Conference, 2014.
- Program Vice-Chair, IEEE International Test Conference, 2013.
- Co-Chair, Joint DFG-NSF-SRC Workshop on “Bugs and Defects in Electronic Systems: The Next Frontier,” Dagstuhl, Germany, 2013.
- Organizing Committee Member and Innovative Practices Track Chair, IEEE VLSI Test Symposium, 2006-2013.
- Registration Chair, IEEE Intl. Conf. on Dependable Systems and Networks, 2003.
- Co-founder, IEEE SELSE (System Effects of Logic Soft Errors Workshop, renamed IEEE Silicon Errors in Logic – System Effects), General Co-Chair (2005, 2006), Program Co-Chair (2007).
- IEEE Pacific Northwest Test Workshop, General Co-Chair (2003, 2004, 2005), Vice General Chair (2002).
- Vice President of Awards and Executive Committee Member, IEEE Council on Electronic Design Automation, 2018-present.
- Steering Committee Member, Center for Advanced Technology Evaluation, Pacific Northwest National Lab, 2017-2019.
- Member, Scientific Advisory Board, European Union Horizon 2020 CONNECT, 2017-2019.
- Visiting Consultant, Institute for Infocomm Research (I2R), A*STAR, Singapore, 2018-2023.
- Member, Strategy Committee, IEEE Council on Electronic Design Automation, 2016-2017.
- Advisory Board Member, Electrical Engineering, Ecole Polytechnique Federale De Lausanne (EPFL), 2015.
- Invited member, DARPA Information Science and Technology Board (ISAT), 2009 – 2012.
- IEEE CAS/CEDA CANDE Committee, Chairman (2010), Secretary (2009), Workshop chair (2008).
- Co-chair, ACM SIGDA Technical Committee on Test and Reliability, 2008-2009.
- Panelist, National Science Foundation, 2004-present.
- Membership Chair, IEEE Test Technology Technical Council, 2004.
- ESDA/IEEE CEDA Kaufman Award (Roles: Chair, Member).
- ACM SIGDA/IEEE CEDA Newton Technical Impact Award in EDA (Roles: Co-Chair, Member).
- IEEE Fellow Evaluation Committee (Role: Member).
- European Design Automation Association Outstanding PhD Dissertation Award (Roles: Chair, Member).
- ACM SIGDA Outstanding PhD Dissertation in EDA (Role: Member).
- ACM/IEEE Design Automation Conference Best Paper Award (Role: Member).
- IEEE Design Automation and Test in Europe Best Paper Award (Role: Member).
- Conference Program Committees
- IEEE International Solid-State Circuits Conference (ISSCC); Hotchips; ACM/IEEE Design Automation Conference (DAC); International Reliability Physics Symposium (IRPS); Dependable Systems and Networks (DSN); International Test Conference (ITC); International Conference Supercomputing (ICS); ACM SIGDA PhD Forum; IEEE VLSI Test Symposium (VTS); ACM/IEEE International Conference on Computer-Aided Design (ICCAD); IEEE International Conference on Computer Design (ICCD); IEEE European Test Symposium (ETS); IEEE Field Programmable Logic and Applications (FPL); IEEE Field Programmable Custom Computing Machines (FCCM); IEEE Asian Test Symposium (ATS); IFIP VLSI-SoC; ACM Great Lakes Symposium on VLSI (GVLSI); International Conference on VLSI Design (VLSID); IEEE Design Automation and Test in Europe (DATE); IEEE Intl. On-line Test Symp. (IOLTS); IEEE International Conference on Parallel and Distributed Systems (ICPADS); IEEE International Conference on Application-Specific Systems, Architectures and Processors (ASAP) and many others.