Publications

R. P. Smith, A. A. Hwang, T. Beetz, E. Helgren, Introduction to semiconductor processing: Fabrication and characterization of p-n junction silicon solar cells, American Journal of Physics, 86, 740 (2018)

D. J. Vine, G. J. Williams, J. N. Clark, C. T. Putkunz, M. A. Pfeifer, D. Legnini, C. Roehrig, E. Wrobel, E. Huwald, G. van Riessen, B. Abbey, T. Beetz, J. Irwin, M. Feser, B. Hornberger, I. McNulty, K. A. Nugent, and A. G. Peele, An in-vacuum X-ray diffraction microscope for use in the 0.7-2.9 keV range, Review of Scientific Instruments 83: 033703 (2012)

M. R. Howells, T. Beetz, H. N. Chapman, C. Cui, J. M. Holton, C. Jacobsen, J. Kirz, E. Lima, S. Marchesini, H. Miao, D. Sayre, D. A. Shapiro, J. C. H. Spence, An assessment of the resolution due to radiation-damage in X-ray diffraction microscopy, Journal of Electron Spectroscopy and Related Phenomena 170: 4-12 (2009)

T. Schäfer, F. Claret, T. Beetz, M. Lerotic, S. Wirick, C. Jacobsen, R. Smith, L. Miller, T. Fanghänel, Radiation sensitivity of natural polymerised organic matter: Clay mineral association effects in the Callovo-Oxfordian argillite, Journal of Electron Spectroscopy and Related Phenomena 170: 49-56 (2009)

C. Jooss, J. Hoffmann, J. Fladerer, M. Ehrhardt, T. Beetz, L. Wu, and Y. Zhu, Electric pulse induced resistance change effect in manganites due to polaron localization at the metal-oxide interfacial region, Physical Review B 77 (13): 132409 (2008)

C. Jooss, L. Wu, T. Beetz, R. F. Klie, M. Beleggia, M. A. Schofield, S. Schramm, J. Hoffmann, Y. Zhu, Polaron melting and ordering as key mechanisms for colossal resistance effects in manganites, Proceedings of the National Academy of Science 102 (34): 13597-13602 (2007)

M. Y. Sfeir, T. Beetz, F. Wang, L. Huang, X.M.H. Haung, M. Huang, J. Hone, S.P. O'Brian, J.A. Misewich, T.H. Heinz, L. Wu, Y. Zhu, L.E. Brus, Optical Spectroscopy of individual single-walled carbon nanotubes of defined chiral structure, Science 312 (5773): 554-556 (2006) Read the BNL press release.

E. C. Walter, T. Beetz, M. Y. Sfeir, L. E. Brus, M. L. Steigerwald, Crystalline Graphite from an Organometallic Solution-Phase Reaction, Journal of the American Chemical Society 128 (49): 15590-15591 (2006)

S. Xiao, J. Tang, T. Beetz, X. Guo, N. Tremblay, T. Siegrist, Y. Zhu, M. Steigerwald, and C. Nuckolls, Transferring Self-Assembled, Nanoscale Cables into Electrical Devices, Journal of the American Chemical Society 128 (33): 10700-10701 (2006)

H. N. Chapman, A. Barty, T. Beetz, C. Cui, H. He, C. Jacobsen, M. R. Howells, S. Marchesini, A. Noy, R. Rosen, D. Shapiro, J. C. H. Spence, U. Weierstall, High-resolution three-dimensional X-ray diffraction microscopy, Journal of the Optical Society of America 23 (5): 1179-1200 (2006)

B. H. Hong, J. Y. Lee, T. Beetz, Y. Zhu, P. Kim, K. S. Kim, Quasi-continuous growth of ultralong multi-walled carbon nanotube arrays, Journal of the American Chemical Society 127 (44): 15336-15337 (2005)

T. Beetz, L. Wu, Y. Zhu, Structure determination of isolated single-walled carbon nanotubes by electron diffraction and diffraction microscopy, Microscopy and Microanalysis 11: 560-561 (2005)

D. Shapiro, P. Thibault, T. Beetz, V. Elser, M. R. Howells, C. Jacobsen, J. Kirz, E. Lima, H. Miao, A. Neiman, Biological Imaging by soft X-ray diffraction microscopy, Proceedings of the National Academy of Science 102 (43): 15343-15346 (2005)

T. Beetz, M. R. Howells, C. Jacobsen, C.-C. Kao, J. Kirz, E. Lima, T. O. Mentes, H. Miao, C. Sanchez-Hanke, D. Sayre, D. Shapiro, Apparatus for X-ray diffraction microscopy and tomography of cryo specimens, Nuclear Instruments and Methods in Physics Research: Section A 545: 459-468 (2005)

T. Beetz, Soft X-ray diffraction imaging with and without lenses and Radition damage sudies, Stony Brook University, PhD thesis (2004)

T. Beetz, C. Jacobsen, Soft X-ray radiation damage studies in PMMA using a cryo-STXM, Journal of Synchrotron Radiation 10: 280-283 (2003)

T. Beetz, M. Feser, H. Fleckenstein, B. Hornberger, C. Jacobsen, J. Kirz, M. Lerotic, E. Lima, M. Lu, D. Sayre, D. Shapiro, A. Stein, D. Tennant and S. Wirick, Soft X-ray Microscopy at the NSLS, Synchrotron Radiation News 16 (3): 11-15 (2003)

T. Beetz, C. Jacobsen and A. Stein, Soft X-ray diffraction tomography - Simulations and first results, Journal de Physique IV 104: 27-30 (2003)

T. Beetz, C. Jacobsen, C. C. Kao, J. Kirz, T. O. Mentes, C. Sanchez-Hanke, D. Sayre and D. Shapiro, Development of a novel apparatus for experiments in soft X-ray diffraction imaging and diffraction tomography, Journal de Physique IV 104: 31-34 (2003)

C. Jacobsen, T. Beetz, M. Feser, A. Osanna, A. Stein and S. Wirick, Spectromicroscopy of biological and environmental systems at Stony Brook: instrumentation and analysis, Surface, Review and Letters 9 (1): 185-191 (2002)

M. Feser, T. Beetz, C. Jacobsen, J. Kirz, S. Wirick, A. Stein and T. Schäfer, Scanning transmission soft x-ray microscopy at beamline X1-A at the NSLS - advances in instrumentation and selected applications, Soft X-ray and EUV Imaging Systems II 4506: 146-153 (2001)

M. Feser, T. Beetz, M. Carlucci-Dayton and C. Jacobsen, Instrumentation advances and detector development with the Stony Brook scanning transmission X-ray microscope, X-ray Microscopy: Proceedings of the Sixth International Conference, W. Meyer-Ilse, A. Warwick and D. T. Attwood, American Institute of Physics 507: 367-372 (2000)

C. Jacobsen, S. Abend, T. Beetz, M. Carlucci-Dayton, M. Feser, K. Kaznacheyev, J. Kirz, J. Maser, U. Neuhäusler, A. Osanna, A. Stein, C. Vaa, Y. Wang, B. Winn and S. Wirick, New developments in scanning microscopy at Stony Brook, X-ray Microscopy: Proceedings of the Sixth International Conference, W. Meyer-Ilse, A. Warwick and D. T. Attwood, American Institute of Physics 507: 12-18 (2000)